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Metrology Engineer – Electron Microscopy & Advanced Characterization
Job Location:
Monthly Salary:
Experience Required:
Posted:
24 May 2026 (30+ days ago)
Posted:
Application Deadline:
21 August 2026
Application Deadline:
Vacancies:
1 Vacancy
Vacancies:
Job Summary
About the Role
We are seeking a Metrology Engineer with deep domain expertise in electron microscopy to join the
Waveguide Metrology Engineering this role you will own end-to-end FIB/SEM workflowsfrom
sample preparation through advanced imaging and analysissupporting the characterization of optical
and semiconductor materials critical to next-generation AR/VR hardware. You will drive automation
develop scalable metrology solutions and collaborate cross-functionally to enable process development
yield improvement and technology roadmap execution.
Requirements
Responsibilities
Own and develop end-to-end sample preparation and imaging workflows using Focused Ion
tBeam (FIB) and Scanning Electron Microscopy (SEM) techniques.
Perform advanced characterization including Scanning Transmission Electron Microscopy
(STEM) and Energy Dispersive X-ray Spectroscopy (EDX/EDS) on complex optical and
semiconductor material systems.
Drive automation of electron microscopy workflows to improve throughput repeatability and data
quality across metrology operations.
Develop and qualify metrology applications for multi-layer multi-material structures in support of
waveguide thin-film and nanofabrication process development.
Partner cross-functionally with process engineering integration manufacturing operations and
other metrology disciplines to deliver actionable characterization data for process control and
yield improvement.
Establish process controls Measurement Standard Operating Procedures (MSOPs) and
specification documents to ensure metrology capability and protect the fab from excursion events.
Collaborate with equipment vendors (e.g. Thermo Fisher Scientific/FEI) to qualify install and
enable state-of-the-art electron microscopy platforms and capabilities.
Cross-train across multiple metrology and inspection disciplines to maintain support continuity
and provide complementary measurements for baselining and qualifying application solutions.
Contribute to metrology development roadmaps support technology ramp-up activities and
deliver leading-edge process capability in collaboration with cross-functional and cross-company
teams.
Minimum Qualifications
Masters degree in Materials Science Engineering Physics Chemistry or a related
scientific/engineering field.
Graduate-level coursework research or hands-on experience involving:
Focused Ion Beam (FIB) and Scanning Electron Microscopy (SEM)
Sample preparation techniques for cross-section and plan-view imaging
STEM and/or EDX analytical methods
Characterization of semiconductor or optical materials
Benefits
Mackin Talent offers an attractive benefits package which includes major medical carrier 15 days of PTO plus Holiday and Sick pay paid volunteer hours paternity/maternity leave and many more. We pride ourselves on our company values the top one being that Relationships Matter. Come experience the Mackin Difference and our welcoming company culture with a focus on teamwork and family. Learn more about Mackin and apply online at .
Required Skills:
We are seeking a Metrology Engineer with deep domain expertise in electron microscopy to join the Waveguide Metrology Engineering this role you will own end-to-end FIB/SEM workflowsfrom sample preparation through advanced imaging and analysissupporting the characterization of optical and semiconductor materials critical to next-generation AR/VR hardware. You will drive automation develop scalable metrology solutions and collaborate cross-functionally to enable process development yield improvement and technology roadmap execution.
